December 03 - December 03
Introduction to quantitative X-ray texture analysis
Almost all physical properties of crystalline materials strongly depend on the crystal orientation. In practice, most commonly used artificial and natural solid materials are polycrystalline and show a texture, a non-random orientation distribution of the crystallites. Therefore the materials properties can only be determined if the texture of a sample is known.
X-ray diffraction is a widely used technique to determine preferred orientations from pole figures. The webinar gives a short introduction to quantitative texture analysis for the materials scientist.
Date: December 3, 2013
Time: 10:00 AM - 11:00 AM EST (4:00 PM - 5:00 PM CET)
Hans te Nijenhuis studied Applied Physics at the Delft University of Technology in the Netherlands, with a focus on the field of physical crystallography. He obtained a PhD degree in Solid State Physics at the University of Nijmegen with a thesis on gas phase deposition of epitaxial layers. Afterwards he joined PANalytical (Almelo, the Netherlands) and is now working in the department Product Management X-ray diffraction.
- Introduction to quantitative X-ray texture analysis
- 3 December 2013, 10:00 - 3 December 2013, 11:00
- UTC-05:00 US/Eastern