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March 17 - March 17

High-resolution diffraction - Exploration of the reciprocal space with high speed

This webinar focuses on single crystal like samples and interpretation of reciprocal space maps. A walk-through from data collection to data analysis is demonstrated in detailed steps for traditional high-resolution 0D optics and recent fast data collection strategies.

The state-of-the-art 2D detectors, allowing faster data collection, expand the use of this technique from academic research or R&D to rapid quality control applications. Examples will be explained and quantified with our current analysis software Epitaxy 4.3a. Time for questions is reserved.

Webinar details

Recorded on Thursday, March 17, 2016
Duration: 35 minutes

Panelist information: Lars Grieger, Application Specialist XRD, PANalytical B.V. Almelo.
Lars is a materials engineer with university degrees from RWTH Aachen, and Imperial College London. His work experience so far, spans PVDF-based biomedical implants, carbon composite propeller blades, friction reduction on CrN PVD tool coatings, lab-on-chip Ag nanoparticle synthesis and nitride semiconductor epitaxy. In 2011 he joined PANalytical as application and product specialist XRD, in Almelo (the Netherlands).

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