March 17 - March 17
High-resolution diffraction - Exploration of the reciprocal space with high speed
This webinar focuses on single crystal like samples and interpretation of reciprocal space maps. A walk-through from data collection to data analysis is demonstrated in detailed steps for traditional high-resolution 0D optics and recent fast data collection strategies.
The state-of-the-art 2D detectors, allowing faster data collection, expand the use of this technique from academic research or R&D to rapid quality control applications. Examples will be explained and quantified with our current analysis software Epitaxy 4.3a. Time for questions is reserved.
Recorded on Thursday, March 17, 2016
Duration: 35 minutes
Panelist information: Lars Grieger, Application Specialist XRD, PANalytical B.V. Almelo.
Lars is a materials engineer with university degrees from RWTH Aachen, and Imperial College London. His work experience so far, spans PVDF-based biomedical implants, carbon composite propeller blades, friction reduction on CrN PVD tool coatings, lab-on-chip Ag nanoparticle synthesis and nitride semiconductor epitaxy. In 2011 he joined PANalytical as application and product specialist XRD, in Almelo (the Netherlands).
- High-resolution diffraction - Exploration of the reciprocal space with high speed
- 17 March 2016, 11:00 - 17 March 2016, 12:00
- UTC-05:00 US/Eastern