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March 27 - March 27

Exploring textured and randomly oriented layers: an overview of X-ray diffraction methods

In this webinar an overview of X-ray scattering methods will be presented that are commonly applied for the non-destructive characterization of textured and randomly oriented polycrystalline layers. Starting from the basics of the methods the webinar will cover experimental aspects including recent hardware developments followed by the evaluation methods of the data. The applicability of the discussed methods to extract structural information of textured and randomly oriented layered structures will be finally illustrated on selected examples.

Webinar details

Date: Thursday, March 27, 2014
Time: 10:00 AM - 10:45 AM EST (3:00 PM - 4:00 PM CET)
Duration: 55 minutes

Panelist information: Zhaohui Bao, Application Specialist XRD, PANalytical B.V., the Netherlands.
Zhaohui Bao, 28, grew up in Ruyang (located in the central part of China). In 2008, he finished Master studies in Physics at Joseph Fourier university in Grenoble, France. Then he pursued a Ph.D. on epitaxial growth, structural and magnetic characterization of uranium dioxide thin films. In 2012 Zhaohui joined PANalytical as an Application Specialist XRD.



  • Exploring textured and randomly oriented layers: an overview of X-ray diffraction methods
  • 27 March 2014, 10:00 - 27 March 2014, 10:45
  • UTC-04:00 US/Eastern

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