March 22 - March 22
Cement - composition, structure and fineness – we are stronger together!
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Global demand for cement continues to increase and analysts project that the industry will maintain a healthy growth rate well into 2020. This positive outlook translates into mounting pressures on the manufacturers to increase throughput of new and existing plants while at the same time striving to reduce the environmental impact of cement manufacture though process optimization and use of clinker substitutes. This presentation will review the importance of elemental and mineralogical analysis and the value of precise analytical data to plant operations. We will also discuss the importance of cement fineness and how precision and timeliness aspects of particle size analysis are related to production control and efforts to optimize grinding and reduce energy consumption.
Why attend? Learn about the value and synergies between X-ray fluorescence (XRF), X-ray diffraction (XRD) and particle size distribution (PSD) analyses in cement manufacture and review the economic impact advanced analytical tools can have on plant performance.
Who should attend? Plant Managers, Process Engineers, Laboratory Managers, QA/QC technicians.
What will you learn? Recognize the importance of implementing robust analytical methods for elemental, mineralogical and fineness characterization of cement and how the data can be used to improve and optimize various aspects of cement production.
Date: 22 March 2017
Time: 15:00 GMT (16:00 CET)
Harald van Weeren, Product Manager XRD / Segment Manager Building Materials - PANalytical B.V. the Netherlands. Harald was born in Hoorn, The Netherlands, in 1975. He started his studies applied physics at the University of Twente, The Netherlands in 1996. In 2002 he finalized his studies with a Master’s Thesis on Nb3Sn superconductors. In that same year he started his PhD research on MgB2 superconductors, where he focused on the material-science- as well as on the applicative aspects of this type of superconductor. Just after finalizing his PhD thesis in 2007 he worked as a Postdoctoral Research Fellow on cryogenic micro-coolers for space applications at the University of Twente. In 2008 he joined PANalytical B.V., Almelo, the Netherlands as product specialist non-ambient X-ray diffraction. Currently he is product manager, focusing on X-ray diffraction for process control and market segment manager for the building materials industry.
Alon Vaisman is Product Development Manager Process Systems for Malvern Instruments. Based at the company’s offices in Westborough MA, USA, he supports manufacturers in variety of industries world-wide in developing and improving their process operations through the use of in-process particle characterization systems. Alon’s background is in Mechanical Engineering and he has over 15 years of applications and support experience.
- Cement - composition, structure and fineness – we are stronger together!
- 22 March 2017, 15:00 - 22 March 2017, 16:00
- UTC+02:00 Europe/Amsterdam