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Webinars
October 26 - October 26

Best practices - Fitting of X-ray reflectivity data with X’Pert Reflectivity

Reflectivity, PANalytical

Webinar abstract

This webinar will focus on the X-ray reflectivity (XRR) data analysis. We will start with a brief discussion on how to judge the quality of the experimental data. Then simulating and fitting on XRR data will be shown in a step-by-step manner, from a simple 2 layers system fitting move towards a more complicated case. Different fitting strategy and practices that help to speeding up the fitting process will also be discussed. A live Q & A will conclude the presentation.

Webinar details

Recorded on October 26, 2017
Duration 1 hour 1 minute

Panelist:
Zhaohui Bao - Application Specialist XRD
Zhaohui is an X-ray diffraction specialist at PANalytical, working specifically with XRD applications and development projects. Before joining PANalytical, Zhaohui did his Ph.D. research on oxide thin films in Karlsruhe, Germany. His main interests lay on high resolution thin films investigations, small angle X-ray scattering.



  • Best practices - Fitting of X-ray reflectivity data with X’Pert Reflectivity
  • 26 October 2017, 11:00 - 26 October 2017, 11:45
  • UTC-05:00 US/Eastern
  • Scientists

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