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November 27 - December 01

Basic X-ray fluorescence SuperQ application course on sequential spectrometer

Fundamental and practical techniques of X-ray fluorescence analysis using sequential wavelength dispersive spectrometers (Zetium, Axios, MagiX, MagiX PRO, PW2404, PW2400, X’Unique, X’Unique II or PW1480) are treated in this course.

A tablet PC will be given to the participants and will contain the course material.

Course content

Emphasis is placed on the daily use of SuperQ and the Omnian standardless software. Practical aspects of parameter selection, matrix effects, sample preparation, quantitative analysis, standardless analysis, calibration and calibration update, monitor correction and results analysis are dealt with extensively. The course is composed of lectures and hands-on sessions using the Axios spectrometers available in our Application Competence Center, Almelo, The Netherlands.

The following aspects will be covered during the course:
• Basic theory of X-ray fluorescence and instrumentation
• Qualitative & Quantitative analysis
• Application Setup
• Calibration, Matrix effect & Sources of errors
• Omnian standardless analysis
• Drift monitors, their implementation and practical use
• Sample preparation of fused beads, pressed pellets, loose powders and liquids

Course details

Language: English (alternatives upon request)
Course duration: 5 days
Number of participants: minimum - 3, maximum - 12

For further information contact your local PANalytical representative or:
Ms. A. Zagoritou, ACC Coordinator
PANalytical B.V.
Application Competence Center
P.O. Box 13
7600 AA Almelo
The Netherlands
Tel: +31 546 534438
Fax: +31 546 534598
E-mail: athina.zagoritou@panalytical.com

Register online, using the button below.
Should you not receive a confirmation mail after submitting the form, you can alternatively fill in the registration form and send it to courses.almelo@panalytical.com.

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Register
  • Basic X-ray fluorescence SuperQ application course on sequential spectrometer
  • Almelo, The Netherlands
  • 27 November 2017, 09:00 - 1 December 2017, 17:00
  • UTC+02:00 Europe/Amsterdam
  • This course is targeted towards new PANalytical XRF system users but also forms a solid refresher for more experienced users.

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