June 04 - June 04
Analysis of the elemental composition of nanomaterials by X-ray fluorescence
In this introductory webinar we will discuss the importance of controlling the elemental composition of nanomaterials and demonstrate how X-ray fluorescence (XRF) can easily be used for a quick (semi-quantitative) screening as well as for an accurate quantification of major and minor elements that are present in a sample.
XRF has the advantage of being a non-destructive technique that can determine elemental compositions from small (tens of milligrams) as well as large (several grams) sample amounts. It can be applied to virtually all forms of materials, such as nanopowders, liquid nanoparticle dispersions and solid nanocomposites and yields representative data.
The webinar targets nanomaterial researchers in academia and industry, as well as process and quality control managers of industrial nanomaterial producers.
Recorded on: 04 June 2015
Duration: 57 minutes
Panelist: Dr. Lieven Kempenaers
In 1999 Lieven Kempenaers started his PhD in Chemistry at the University of Antwerp (Belgium) with dedicated focus on the use of X-rays in elemental analysis.
In 2003 Lieven completed his PhD in Chemistry and used his XRF knowledge and experience as an XRF Application Specialist and later on as Product Manager for PANalytical, the Netherlands.
From 2008 until 2012 he was re-located to the Asia Pacific regional head quarters in Singapore and took on the assignment as Asia Pacific Regional Product Manager XRF.
Once back in the Netherlands, he used his Asia Pacific experience as the global product manager for the benchtop XRF instruments.
- Analysis of the elemental composition of nanomaterials by X-ray fluorescence
- 4 June 2015, 00:00 - 4 June 2015, 00:00
- UTC+01:00 Europe/Amsterdam