February 04 - February 04
Advances in coatings and multilayer composition and thickness analysis
The analysis of multilayer structures can be complex, and the analysis of combined thickness and composition even more challenging. X-ray fluorescence spectroscopic methods are an attractive fast and non-destructive technique compared to wet chemical methods and can perform both thickness and composition analysis at the same time. Although widely used, the setup of an application has typically been based on a “trial and error” approach requiring significant expertise to do manual optimization, and selection of the best fluorescence lines to use. Advances in analysis software have greatly simplified the application set up process and removed the guess work.
In this webinar theory behind multilayer thickness and composition analysis by XRF will be discussed, with several application examples with actual measurements presented, including coatings on steel.
Recording date: Tuesday, February 4, 2014 10:00 am
Eastern Standard Time (New York, GMT-05:00)
Panelist Information: Christos Tsouris, PANalytical XRF Product Manager, the Netherlands
Duration: 45 minutes
- Advances in coatings and multilayer composition and thickness analysis
- 4 February 2014, 10:00 - 4 February 2014, 10:45
- UTC-05:00 US/Eastern