Knowledge center

Back to overview
Events
April 25 - April 25

A practical approach to thin film metrology in Santa Clara California

PANalytical

This complimentary seminar was created by Dr. Julie Quinn - XRD Product Manager of PANalytical. Register today, seats are limited.

Are you analyzing thin films? Is thin film X-ray metrology a bottleneck in your production steps? Did you know that your PANalytical system can automate analysis of your data? Let us give you some useful tips on data collection and analysis using your PANalytical hardware and software programs.

This complimentary one day seminar will include lectures and discussions on sample optimization and analysis, best practices for both polycrystalline and epitaxial thin films. Measurements such as grazing incidence diffraction and reflectometry of polycrystalline films, rocking curves and reciprocal space mapping for epitaxial films will be discussed. Additionally, there will be live software demonstrations of analysis procedures and tips using X’Pert Reflectivity and X’Pert Epitaxy analysis software packages. Advanced analysis techniques, such as film strain, in-plane analysis and Ultra-fast reciprocal space mapping with our PIXcel3D detector, will also be discussed.

Venue:
Embassy Suites by Hilton Santa Clara Silicon Valley
2885 Lakeside Dr.
Santa Clara, California 95054
408-496-6400

Seminar details

Seminar instructor: Dr. Michael Hawkridge

Preliminary agenda to include the following topics:
Polycrystalline Films Section
XRR and Reflectivity software
Grazing Incidence and HighScore software
Thin film texture and residual stress, in-plane discussion
Epitaxial Film Section
A High Resolution Diffraction Primer
Rocking Curves and Coupled Scans, analysis in Epitaxy Software
Reciprocal Space Mapping and analysis in Epitaxy Software
Advanced Techniques

Breakfast, lunch and breaks will be included.

Once registered you will recieve a communication from Linda Bratica. Questions on the seminar, email Linda Bratica at Linda.Bratica@panalytical.com

  • A practical approach to thin film metrology in Santa Clara California
  • United States
  • 25 April 2017, 08:30 - 25 April 2017, 05:00
  • UTC-08:00 America/Los Angeles

Share this article