Knowledge center

Back to overview
Events
March 23 - March 23

A practical approach to thin film metrology at PennState

PANalytical

This complimentary course was created as a collaborative learning opportunity by Nichole Wonderling - X-ray Scattering Manager of PSU and Dr. Julie Quinn - XRD Product Manager of PANalytical. Register today, seats are limited.

Are you analyzing thin films? Is thin film X-ray metrology a bottleneck in your production steps? Did you know that your PANalytical system can automate analysis of your data? Let us give you some useful tips on data collection and analysis using your PANalytical hardware and software programs.

This complimentary one day seminar will include lectures and discussions on sample optimization and analysis best practices for both polycrystalline and epitaxial thin films. Measurements such as grazing incidence diffraction and reflectometry of polycrystalline films and rocking curves and reciprocal space mapping for epitaxial films will be discussed. Additionally, there will be a live demonstration of film/wafer alignment on an X’Pert³ MRD using Data Collector software, as well as live software demonstrations of analysis procedures and tips using X’Pert Reflectivity and X’Pert Epitaxy analysis software packages. Advanced analysis techniques, such as film strain, in-plane analysis and Ultra-fast reciprocal space mapping with our PIXcel3D detector, will also be briefly discussed.

Once registered you will recieve a communication from Linda Bratica with course venue, local hotel offerings, parking and details on items to bring with you on March 23, 2017. Questions on the course, email Linda Bratica at Linda.Bratica@panalytical.com

Course details

Course instructor: Dr. Michael Hawkridge

Preliminary agenda to include the following topics:
Polycrystalline Films Section
XRR and Reflectivity software
Grazing Incidence and HighScore software
Thin film texture and residual stress, in-plane discussion
Epitaxial Film Section
A High Resolution Diffraction Primer
Rocking Curves and Coupled Scans, analysis in Epitaxy Software
Reciprocal Space Mapping and analysis in Epitaxy Software
Advanced Techniques

Breakfast, lunch and breaks will be included.

  • A practical approach to thin film metrology at PennState
  • United States
  • 23 March 2017, 08:30 - 23 March 2017, 05:00
  • UTC-04:00 America/New York

Share this article