Epsilon 3XLE

Outperforming your expectations

  • X-ray safety assured
  • High sensitivity through smart excitation and detection technology
  • Outstanding analytical performance with extending ultra-light elements (C – Am)
  • Omnian (semi-quantitative), FingerPrinting, Stratos (multi-layer analysis), Oli-Trace and regulatory compliance modules

PANalytical XRF benchtop spectrometers, history

New developments

Epsilon 3XLE instruments combine the latest excitation and detection technology with state-of-the-art analysis software. The 15 Watt x-ray tube in combination with the high current (3 mA), latest silicon drift detector SDDUltra together with the compact design of the optical path, delivers even better analytical performance than 50 Watt power EDXRF and even benchtop WDXRF systems - with the added bonus of power efficiency. The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra light element analysis of even carbon, nitrogen and oxygen.

Compliance readiness

The Epsilon 3XLE conforms to the requirements of international standards such as ASTM, ISO and DIN and is supported by PANalytical’s worldwide network of sales and service specialists. It is a cost–effective and viable alternative to conventional systems for a wide variety of industries and applications, including RoHS und WEEE.

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What is XRF?
Materials research

XRF is an analytical technique that can be used to determine the chemical composition of a sample. Read more

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