The measurements are carried out directly on the sample itself with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.
Small analyzing spot
Small pieces or small inclusions in samples can easily be analyzed with a collimated X-ray beam. The spot size on the sample is typically 0.8 x 1.2 mm.
With the help of the color camera and crosshair in the picture, the user can manually position the sample on the analyzing spot of the instrument.
After each analysis, a photograph of the analysis spot is stored on the built-in computer. With a single click an analysis report is generated that includes the photograph.