Epsilon 1

Non-destructive analysis

The measurements are carried out directly on the sample itself with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.


Small analyzing spot

Small pieces or small inclusions in samples can easily be analyzed with a collimated X-ray beam. The spot size on the sample is typically 0.8 x 1.2 mm.


Sample positioning

With the help of the color camera and crosshair in the picture, the user can manually position the sample on the analyzing spot of the instrument.


Analysis report

After each analysis, a photograph of the analysis spot is stored on the built-in computer. With a single click an analysis report is generated that includes the photograph.












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Materials research

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