Robust and flexible quantification for RoHS-2, WEEE and ELV
Spot-on results are provided for a wide range of applications, like RoHS-2, toys, jewelry, rocks and final product inspection. This is made possible by Omnian, PANalytical’s market-leading standardless analysis software package, also used on the more advanced XRF instruments.
As an out-of-the-box solution, Omnian can be used to analyze a wide variety of elemental compositions from sodium to americium across the periodic table.
With dedicated calibrations, it is possible to follow international test methods, like ASTM F2617 (RoHS), or to screen according to the specifications described by ASTM F963 (toys) and IEC 62123 (electronics).
XRF is a well-established solution for screening and quantification of toxic metals and compounds. The toxic metal content in electronic goods is regulated by global directives, like RoHS-2, WEEE, ELV, the Administration on the Control of Pollution Caused by Electronic Information Products (Chinese equivalent of RoHS) and other similar directives. All these directives have a slightly different scope, but the commonalities are the restriction of cadmium, lead, mercury, hexavalent chromium and several brominated phenylic flame retardants. ASTM F2617-15 is a well accepted test method to quantify the concentration of the restricted elements and compounds. Our data sheet demonstrates the capabilities of the Epsilon 1 to comply with ASTM F2617-15, even with an analyzing spot size of 0.8 x 1.2 mm.