Flexible elemental analysis for research and education
The Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer and analysis software. Powered by the latest advances in excitation and detection technology the Epsilon 1 is a star performer in the low-cost benchtop instrument class. A well-designed optical path, a wide range of excitation capabilities ranging from 10 to 50 kV for light and heavier elements and a highly sensitive SDD detector system contribute to the uniqueness of Epsilon 1.
The system software has the flexibility to perform basic to more sophisticated analyses, such as determination of layer thickness and composition of metals and coatings using Stratos. The FingerPrinting software module can carry out cluster analysis based on PCA of spectral X-ray fingerprints of a wide variety of materials.
Key specifications and options
|Sample handling||X-ray tube||Detector||Software features|
|Highly repeatable sample positioning||High-stability ceramic side window||High-resolution, typical 135 eV||Operator mode with big buttons for easy operation|
|Any sample with maximum dimensions of 15 x 12 x 10 cm (WxDxH)||50 micrometer thin window (Be)||8 micrometer thin window (Be)||Advanced mode with many features|
|Spillage protection against liquids||Silver anode, ideal for phosphorus and sulfur analysis||High count rate detector capacity||Stratos module|
|Max voltage 50 kV, ideal for heavier elements||FingerPrinting module|