High-speed sample throughput featuring quick turnaround times
Ultrafast sample loading in combination with a high-speed 1D detector such as X’Celerator allow a higher sample throughput that enables the user to control their processes more effectively. Measurement times of 5 minutes can be easily achieved.
TWIN - Intelligent automation
A stand-alone CubiX³ can be combined with all common automation equipment. PANalytical TWIN solutions combine a PANalytical XRF and a PANalytical XRD system. It uses the single interface of the SuperVisor software to announce all samples just once, to route the sample to one or both systems, and to control the actual measurements. The results can be merged before transmission for a joint analysis report.
- One user interface for both XRD and XRF
- Robot or conveyor connections possible
- Two complete systems for simultaneous analyses
- One sample for both methods, one result
- Support of 40 mm and 51 mm sample holder rings
Push-button measurements for easy operation and virtually no learning curve
The Industry and Quantify software packages handle measurements as well as complex calculations for industry-specific parameters. With a push of a button the operator can measure and analyze even unknown samples.
The Walk-up operator interface enables a fully automated XRD measurement and analysis that allows at any time access for adding new samples, operates also in a regulated environment, and requires no knowledge of XRD to achieve results.
High-speed XRD systems like CubiX³ allow the use of standardless methods such as Rietveld quantification. RoboRiet enables the operator to perform such Rietveld quantifications completely automatic and transfers the results to a customer defined destination (such as LIMS, paper or table).
Robust design for industrial environments
The robust design of the CubiX³ allows the use of the X-ray diffractometer even in remote and dusty locations. The goniometer, optics and detectors are dust-protected inside the enclosure to prevent unexpected downtimes.