Formal cooperation agreement between PANalytical and OBLF
In January 2002, PANalytical and OBLF GmbH announced a formal cooperation agreement between the two companies. Headquartered in Witten, Germany, OBLF offers expertise in optical emission spectrometry for metals and alloys. PANalytical X-ray fluorescence (XRF) spectrometers and OBLF optical emission spectrometers perform complementary roles in the analysis of solid metals. As such, they are ideal for metal analysis laboratories.
The agreement includes the exchange of marketing and sales intelligence as well as technical expertise, and extends to the exchange of development knowhow and joint development projects.
A productive relationship
This cooperation has already proved valuable across a number of projects for fully automated laboratory systems. PANalytical takes full project responsibility when integrating its own X-ray spectrometers and OBLF optical emission spectrometers into tailored automation systems. Both companies continue to operate independently through their own sales channels. Within the agreement, however, they strive for exclusive co-operation in the field of laboratory automation.
Complementary spectrometry capabilities
X-ray fluorescence (XRF) spectrometry is the non-destructive analysis of solid samples in which oxidic sample material (e.g. slags) can be analyzed. Depending on the element, the analysis range spans sub-ppm to 100% levels. The strength of optical emission spectrometry (OES), on the other hand, lies in ultra-low concentration (ppm-level) analysis even of light elements such as carbon and nitrogen. So, when employed simultaneously, XRF and OES allow the measurement of dozens of elements, within seconds.
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