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Application note

X-ray diffraction techniques for characterization of thin film solar cells

The present contribution is providing an overview of the X-ray scattering methods and geometries available on the Empyrean platform for the characterization of polycrystalline and epitaxial solar cell structures.

High efficiency thin film photovoltaic solar cell devices are being created in a variety of crystallographic forms: epitaxial, polycrystalline, micro- or nanocrystalline or amorphous.

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