Quick and accurate determination of silicon on paper in only 30 seconds
In this data sheet it is shown that the Epsilon 1 is a fast and accurate solution for this application. Furthermore the X-ray fluorescence (XRF) instrument can be installed inside the factory close to the production facilities to create a fast feedback loop.
In the paper industry silicon is coated on paper to create a non-sticking release layer, which is used for applications such as tape and backing paper. It is essential to control the amount of silicon during the production process, where insufficient silicon lowers the quality of the end product, and too much adds extra costs to the production process. Therefore ideally a fast analyzer can be used to monitor the silicon concentration during the production process.Download application note