Knowledge center

Back to overview
Application note

Pair distribution function analysis. Total scattering experiments using high-energy X-rays on a laboratory system

Analyzing powder diffraction data of nanocrystalline and amorphous materials using the atomic pair distribution function (PDF) method, provides useful information about the long- and short-range ordering of the atoms in the materials.

Recent years have shown an increased interest in the study of nanocrystalline materials due to their specific properties for application in e.g. semiconductors, pharmaceuticals and polymers.

Download application note
You'll need Adobe Acrobat to read this file. Download it here

Share this article