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Application note

Omnian - Light-matrix analysis - correcting finite thickness (FT) and fluorescence volume geometry (FVG) effects

This data sheet demonstrates Omnian’s ability to deal with the challenge of finite thickness (FT) in thin samples and fluorescence volume geometry (FVG) effect in thicker low density samples.

Relatively thin samples present problems for conventional XRF analysis, because the relationship between count rate and concentration can be significantly influenced by sample thickness. Omnian corrects for this effect by applying a Fundamental Parameter (FP)-based FT correction.

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