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Application note

Multi-technique nanoparticle characterization on a laboratory X-ray diffractometer

This application note shows the possibilities of Empyrean in the field of nanomaterial characterization, by combining SAXS (small-angle scattering), LPA (line profile analysis) and PDF (pair distribution function), also in non-ambient conditions. The Empyrean allows measurements of many types of samples and supports many different applications.

Small-angle scattering is used to determine particle and cluster dimensions and is insensitive to length scales below 1 nm i.e. those comprising small domains and crystal structure. Small-angle scattering is therefore useful in nanotechnologies because it is measuring directly the particle and cluster dimensions that are often most significant in the exploitation of nanoparticle properties.

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