Fast small spot elemental mapping
Defects in polymers
Fast inorganic characterization of polymer defects is crucial for quality control and is complementary to molecular spectroscopic techniques such as FT-IR and Raman spectroscopy. The latest advances in integrating XRF technology enable bulk analysis together with small spot analysis and elemental mapping on a single platform. The ED core, using SumXcore technology, is capable of simultaneous analysis of the elemental composition of small spots. This enables much faster elemental mapping than commonly used WD-XRF mapping options.
This data sheet describes the small spot mapping, SSM, of a dark spot or defect in a polyolefinic sample.Download application note