Seamless integration in automation
The only automatable benchtop diffractometer for high sample throughput
Aeris can be connected with a belt or a robot for fast and automated sample processing.
The power of combining technologies
The twin solution provides full material characterization by adding elemental composition information from Zetium to the phase identification by Aeris.
Industry standard sample holders tailored to your needs
• Collection of 51.5 mm sample holders
• 40 mm sample holders
Fast analysis, maximum uptime
Rapid analysis minimizes feedback loops and allows early intervention for process optimization. Typical measurement times of Aeris are less than 10 minutes per sample.
Uptime of the analytical equipment is key for reliable process control. From the ground up, Aeris has been designed for maximum uptime.
Strong and robust
The only benchtop XRD instrument with external sample loading for ultimate dust protection of the heart of the instrument.
Minimum of infrastructural requirements
No cooling water, no chiller, no compressed air - the only thing you need is a single-phase power socket.
Compatible with all common industry standards; from LIMS interfacing protocols to various industry-standard sample holders.
An easy touch
The most intuitive X-ray diffractometer
With the built-in touch screen your results are always just a few taps away:
1. Place your sample
2. Select measurement program
3. View results