2830 ZT

2830 ZT, PANalytical
Features

The 2830 ZT is supplied with PANalytical’s SuperQ software, which includes a software package specifically designed for multi-layer analysis.

2830 ZT, PANalytical
Specifications

The 2830 ZT for superior light-element performance, has key features that maximize sensitivity and stability of 2830 ZT for light elements.

2830 ZT, PANalytical
What can it do for you?

The instrument's software has a wide range of modules designed for flexible operation by researchers and engineers.

SuperQ Thin Film, PANalytical
SuperQ Thin Film

SuperQ Thin Film software platform makes accurate process control and wafer analysis easier than ever.

XPert ProThin Film, PANalytical
Now used for thin film metrology

X-ray metrology is the ideal tool for analysis of compound semiconductors in mass production and development.

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